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Volumn 54, Issue 11, 1996, Pages 7662-7665
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Saturation of the internal photoemission effect in forward biased silicon junctions
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0037567024
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.54.7662 Document Type: Article |
Times cited : (3)
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References (7)
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