Hot carrier internal thermionic photoemission in pulsed CO2-laser-excited n+-p silicon junctions

IEEE Journal of Quantum Electronics

Volumn 33, Issue 12, 1997, Pages 2203-2208

  Encinas Sanz, F ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

Charge carrier process; Hot carrier plasma; Laser radiation effects; Photoelectricity; Semiconductor junctions

Indexed keywords

CARBON DIOXIDE LASERS; HOT CARRIERS; LASER BEAM EFFECTS; LASER PULSES; PHOTOEMISSION; SEMICONDUCTOR DEVICE MODELS;

THERMIONIC EMISSION;

SEMICONDUCTOR JUNCTIONS;

EID: 0031332172     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.644103     Document Type: Article

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