-
1
-
-
0024082698
-
High-speed linear array surface inspection system
-
Sept.
-
P. W. Loose and M. D. Dryer, "High-speed linear array surface inspection system," Iron and Steel Engineering, pp. 28-34 (Sept. 1988).
-
(1988)
Iron and Steel Engineering
, pp. 28-34
-
-
Loose, P.W.1
Dryer, M.D.2
-
2
-
-
0010294268
-
Evaluation procedure for imaging in web inspection
-
J. Laitinen, "Evaluation procedure for imaging in web inspection," Proc. SPIE 2348, 14-25 (1995).
-
(1995)
Proc. SPIE
, vol.2348
, pp. 14-25
-
-
Laitinen, J.1
-
3
-
-
0010256271
-
Method for evaluation of imaging in automated visual web inspection
-
J. Laitinen and I. Moring, "Method for evaluation of imaging in automated visual web inspection," Opt. Eng. 36(8), 2184-2196 (1997).
-
(1997)
Opt. Eng.
, vol.36
, Issue.8
, pp. 2184-2196
-
-
Laitinen, J.1
Moring, I.2
-
4
-
-
0029732693
-
MTF as a figure of merit in visual surface inspection
-
J. Laitinen and I. Moring, "MTF as a figure of merit in visual surface inspection," Proc. SPIE 2599, 380-387 (1996).
-
(1996)
Proc. SPIE
, vol.2599
, pp. 380-387
-
-
Laitinen, J.1
Moring, I.2
-
5
-
-
0001829251
-
Image quality in automated visual web inspection
-
J. Laitinen, "Image quality in automated visual web inspection," Proc. SPIE 3029, 78-89 (1997).
-
(1997)
Proc. SPIE
, vol.3029
, pp. 78-89
-
-
Laitinen, J.1
-
7
-
-
0028391852
-
Radiometric CCD camera calibration and noise estimation
-
G. Healey and R. Kondepudy, "Radiometric CCD camera calibration and noise estimation," IEEE Trans. Patt. Anal. Mach. Intell. 16(3), 267-276 (1994).
-
(1994)
IEEE Trans. Patt. Anal. Mach. Intell.
, vol.16
, Issue.3
, pp. 267-276
-
-
Healey, G.1
Kondepudy, R.2
-
8
-
-
0028672163
-
Image-sensing model and computer simulation for CCD camera systems
-
M. Subbarao and M.-C. Lu, "Image-sensing model and computer simulation for CCD camera systems," Machine Vision and Applications, 7(4), 277-289 (1994).
-
(1994)
Machine Vision and Applications
, vol.7
, Issue.4
, pp. 277-289
-
-
Subbarao, M.1
Lu, M.-C.2
-
9
-
-
0025679763
-
Signal-to-noise ratio analysis of charge-coupled device imagers
-
P. D. Burns, "Signal-to-noise ratio analysis of charge-coupled device imagers," Proc. SPIE 1242, 187-194 (1990).
-
(1990)
Proc. SPIE
, vol.1242
, pp. 187-194
-
-
Burns, P.D.1
-
11
-
-
0019669454
-
Correction of pixel nonuniformities for solid-state imagers
-
T. R. Hsing, "Correction of pixel nonuniformities for solid-state imagers," Proc. SPIE 292, 218-224 (1981).
-
(1981)
Proc. SPIE
, vol.292
, pp. 218-224
-
-
Hsing, T.R.1
-
12
-
-
0020995734
-
A need and method for nonuniformity correction in solid state image sensors
-
S. C. Tanaka, "A need and method for nonuniformity correction in solid state image sensors," Proc. SPIE 350, (1982).
-
(1982)
Proc. SPIE
, vol.350
-
-
Tanaka, S.C.1
-
13
-
-
0004381259
-
Method for determining the electron number in charge-coupled measurement devices
-
B. Stark, B. Nölting, H. Jahn, and K. Andert, "Method for determining the electron number in charge-coupled measurement devices," Opt. Eng. 31(4), 852-856.
-
Opt. Eng.
, vol.31
, Issue.4
, pp. 852-856
-
-
Stark, B.1
Nölting, B.2
Jahn, H.3
Andert, K.4
-
14
-
-
0029457698
-
Studies on the measurement of charge transfer efficiency and photoresponse nonuniformity of linear charge-coupled devices
-
G. Wan, X. Gong, Z. Luo, and F. Jing, "Studies on the measurement of charge transfer efficiency and photoresponse nonuniformity of linear charge-coupled devices," Opt. Eng. 34(11), 3254-3260 (1995).
-
(1995)
Opt. Eng.
, vol.34
, Issue.11
, pp. 3254-3260
-
-
Wan, G.1
Gong, X.2
Luo, Z.3
Jing, F.4
-
15
-
-
84958484730
-
How to select cameras for machine vision
-
N. Wittels, J. R. McClellan, K. Cushing, W. Howard III, and A. Palmer, "How to select cameras for machine vision," Proc. SPIE 1005, 44-53 (1988).
-
(1988)
Proc. SPIE
, vol.1005
, pp. 44-53
-
-
Wittels, N.1
McClellan, J.R.2
Cushing, K.3
Howard III, W.4
Palmer, A.5
-
16
-
-
84958480806
-
Characterization and correction of image acquisition system response for machine vision
-
J. McClellan, "Characterization and correction of image acquisition system response for machine vision," Proc. SPIE 1194, 62-73 (1989).
-
(1989)
Proc. SPIE
, vol.1194
, pp. 62-73
-
-
McClellan, J.1
-
17
-
-
0348204010
-
Determination of radiometric and geometric characteristics of frame grabbers
-
H. A. Beyer, "Determination of radiometric and geometric characteristics of frame grabbers," Proc. SPIE 2067, 93-103 (1993).
-
(1993)
Proc. SPIE
, vol.2067
, pp. 93-103
-
-
Beyer, H.A.1
-
20
-
-
0026461584
-
TDI charge-coupled devices: Design and applications
-
H.-S. Wong, Y. L. Yao, and E. S. Schlig, &TDI charge-coupled devices: design and applications,& IBM Journal of Research and Development, 36(1), 83-106 (1992).
-
(1992)
IBM Journal of Research and Development
, vol.36
, Issue.1
, pp. 83-106
-
-
Wong, H.-S.1
Yao, Y.L.2
Schlig, E.S.3
-
21
-
-
0003793552
-
-
Prentice-Hall, Englewood Cliffs, NJ
-
A. V. Oppenheim and R. W. Schafer, Digital Signal Processing, p. 416, Prentice-Hall, Englewood Cliffs, NJ (1975).
-
(1975)
Digital Signal Processing
, pp. 416
-
-
Oppenheim, A.V.1
Schafer, R.W.2
-
26
-
-
0004084482
-
-
John Wiley & Sons, New York
-
M. V. Klein and T. E. Furtak, Optics, 2nd ed., p. 206, John Wiley & Sons, New York (1986).
-
(1986)
Optics, 2nd Ed.
, pp. 206
-
-
Klein, M.V.1
Furtak, T.E.2
-
27
-
-
85075833569
-
Machine vision for the automated inspection of web materials
-
L. Norton-Wayne, M. Bradshaw, and C. Sanby, "Machine vision for the automated inspection of web materials," Proc. SPIE 1989, 2-13 (1993).
-
(1993)
Proc. SPIE
, vol.1989
, pp. 2-13
-
-
Norton-Wayne, L.1
Bradshaw, M.2
Sanby, C.3
-
28
-
-
0028497829
-
A relative entropy-based approach to image thresholding
-
C.-I. Chang, K. Chen, J. Wang, and M. L. G. Althouse, "A relative entropy-based approach to image thresholding," Pattern Recognition, 27(9), 1275-1289 (1994).
-
(1994)
Pattern Recognition
, vol.27
, Issue.9
, pp. 1275-1289
-
-
Chang, C.-I.1
Chen, K.2
Wang, J.3
Althouse, M.L.G.4
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