Experimental evaluation of CCD and CMOS cameras in low-light-level conditions

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3827, Issue , 1999, Pages 60-65

  Laitinen, Jyrki ^a   Ailisto, Heikki J ^a  

^a VTT TECHNICAL RESEARCH CENTRE OF FINLAND   (Finland)

Author keywords

Ccd; CMOS; Low light level; Surveillance; Umts

Indexed keywords

CMOS INTEGRATED CIRCUITS; MOBILE TELECOMMUNICATION SYSTEMS; NOISE FIGURE; PIXELS; SIGNAL TO NOISE RATIO; STATISTICS;

CONSUMER ELECTRONICS APPLICATIONS; EMERGING APPLICATIONS; EXPERIMENTAL EVALUATION; ILLUMINATION CONDITIONS; PERFORMANCE STANDARDS; RESEARCH CHARACTERISTICS; UNIVERSAL MOBILE TELECOMMUNICATIONS SYSTEMS; VARIABLE ILLUMINATION;

CCD CAMERAS;

EID: 84995626489     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.361002     Document Type: Conference Paper

References (5)

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3. Janesick, J. "CCD transfer method-standard for absolute performance of CCDs and digital CCD camera systems". SPIE, Vol. 3019, pp. 70-102.
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5. Laitinen, J., Moring, I., "Method for evaluation of imaging in automated visual web inspection". Optical Engineering, Vol. 36, No. 8, pp. 2184-2196, 1997.