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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 B, 2001, Pages 4304-4308

Structural transformations during Sb adsorption on Si(111)-In(4×1) reconstruction

(4) Rao, B V a Gruznev, D V a Tambo, T a Tatsuyama, C a

Author keywords

InSb; Reflection high energy electron diffraction; Sb adsorption; Scanning tunneling microscopy; Si(111) In(4 1); Structural transformation; Surface reaction

Indexed keywords

ADSORPTION; COALESCENCE; ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SUBSTRATES; SURFACE REACTIONS; SURFACE STRUCTURE;

STRUCTURAL TRANSFORMATIONS;

SEMICONDUCTOR GROWTH;

EID: 0035357623 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.4304 Document Type: Article

Times cited : (5)

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