A sensitive and fast radio frequency single-electron transistor

Nanotechnology

Volumn 12, Issue 2, 2001, Pages 96-99

  Aassime, A ^a,b   Delsing, P ^a   Claeson, T ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b CEA SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON BEAM LITHOGRAPHY; NATURAL FREQUENCIES; SENSITIVITY ANALYSIS; SHOT NOISE; SPECTRUM ANALYSIS; SQUIDS;

SINGLE-ELECTRON TRANSISTORS (SET);

TRANSISTORS;

EID: 0035356863     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/12/2/304     Document Type: Conference Paper

References (21)

1. Single charge tunneling, coulomb blockade phenomena in Nanostructures
2. Single charge tunneling, coulomb blockade phenomena in nanostructures