Temperature dependence of tunnel magnetoresistance

Journal of Applied Physics

Volumn 89, Issue 11 II, 2001, Pages 7570-7572

  Hagler, T ^a   Kinder, R ^a,b   Bayreuther, G ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035356203     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1359229     Document Type: Article

References (12)

1. M. Jullière, Phys. Lett. 54A, 225 (1975).
2. C. H. Shang, J. Nowak, R. Jansen, and J. S. Moodera, Phys. Rev. B 58, R2917 (1998).
3. J. G. Simmons, J. Appl. Phys. 35, 2655 (1964).
4. J. S. Moodera, L. R. Kinder, T. M. Wong, and R. Meservey, Phys. Rev. Lett. 74, 3273 (1995).
5. S. Zhang, P. M. Levy, A. C. Marley, and S. S. P. Parkin, Phys. Rev. Lett. 79, 3744 (1997).
6. J. Zhang and R. M. White, J. Appl. Phys. 83, 6512 (1998).
7. R. Jansen and J. S. Moodera, Phys. Rev. B 61, 9047 (2000).
8. A. H. MacDonald, T. Jungwirth, and M. Kasner, Phys. Rev. Lett. 81, 705 (1998).
9. L. I. Glazman and K. A. Matveev, Zh. Eksp. Teor. Fiz. 94, 332 (1988).
10. N. F. Mott, Philos. Mag. 19, 835 (1969).
11. G. Lugert and G. Bayreuther, Phys. Rev. B 38, 11068 (1988).
12. J. C. S. Kools, W. Kula, D. Mauri, and T. Lin, J. Appl. Phys. 85, 4466 (1999).