Critical area computation for missing material defects in VLSI circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 20, Issue 5, 2001, Pages 583-597

  Papadopoulou, E ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Breaks; Critical area; Missing material defects; Opens; Via blocks; VLSI layout; Voronoi diagrams; Yield prediction

Indexed keywords

ALGORITHMS; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; POLYNOMIALS; PROBABILITY DENSITY FUNCTION;

VORNOI DIAGRAMS;

VLSI CIRCUITS;

EID: 0035335551     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/43.920683     Document Type: Article

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