Relationship between work function and current fluctuation of field emitters: Use of SK chart for evaluation of work function

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 3, 2001, Pages 992-994

  Gotoh, Y ^a   Tsuji, H ^a   Ishikawa, J ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CURRENT VOLTAGE CHARACTERISTICS; DIAMONDS; DOPING (ADDITIVES); ELECTRIC CURRENTS; NITRIDES; TRANSITION METAL COMPOUNDS; ULTRAHIGH VACUUM;

CURRENT FLUCTUATIONS;

FIELD EMISSION CATHODES;

EID: 0035326440     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1350836     Document Type: Conference Paper

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