Triple-junction issues in field emission displays

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 19, Issue 3, 2001, Pages 683-686

  Ma, Xianyun ^a   Sudarshan, T S ^a  

^a The Department of Mechanical Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC INSULATORS; ELECTRODES; SEMICONDUCTOR JUNCTIONS; THIN FILMS; VACUUM APPLICATIONS;

THIN-WALL SPACERS;

FIELD EMISSION DISPLAYS;

EID: 0035326381     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1375823     Document Type: Conference Paper

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