AFM observation of surface acoustic waves emitted from single symmetric SAW transducers

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 48, Issue 3, 2001, Pages 641-642

  Hesjedal, Thorsten ^a,b   Behme, Gerd ^c  

^a IEEE   (United States)

^b Stanford University   (United States)

^c PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERDIGITAL TRANSDUCERS (IDT); SCANNING ACOUSTIC FORCE MICROSCOPY (SAFM);

ACOUSTIC IMAGING; ACOUSTIC TRANSDUCERS; MICROSCOPIC EXAMINATION; SUBSTRATES; ULTRASONIC WAVES; X RAY DIFFRACTION;

ACOUSTIC SURFACE WAVE DEVICES;

ARTICLE;

EID: 0035324472     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.920685     Document Type: Article

References (11)

1. High-velocity pseudosurface waves (HVPSAW)
2. SAW device applications of longitudinal leaky surface waves on lithium tetraborate
3. High-frequency bandpass filter using polycrystalline diamond
4. Scanning Michelson interferometer for imaging surface acoustic wave fields
5. Recent advances in SAW laser probe
6. Scanning-electron microscope observations of propagating acoustic-waves in surface acoustic-wave devices
7. X-ray imaging and diffraction from surface phonons on GaAs
8. Detection of surface acoustic waves by scanning force microscopy
9. Nanoscale determination of phase velocity by scanning acoustic force microscopy
10. Simultaneous bimodal surface acoustic-wave velocity measurement by scanning acoustic force microscopy
11. Imaging of acoustic fields in bulk acoustic-wave thin-film resonators