Structural and compositional defects in high-Jc Bi-2223 tapes

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 2, 1999, Pages 2440-2445

  Holesinger, Terry G ^a,b   Bingert, John F ^a,b   Willis, Jeffrey O ^a,b   Li, Qi ^a,b   Parrella, Ronald D ^a,b   Teplitsky, Mark D ^a,b   Rupich, Martin W ^a,b   Riley Jr , Gilbert N ^a,b  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CHEMICAL ANALYSIS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; ENERGY DISPERSIVE SPECTROSCOPY; MAGNETIC TAPE; MICROSTRUCTURE; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY;

CURRENT LIMITING MICROSTRUCTURES; FILAMENT MICROSTRUCTURES; QUANTITATIVE COMPOSITIONAL ANALYSIS;

SUPERCONDUCTING MATERIALS;

EID: 0032682852     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.784969     Document Type: Article

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