Scanning noninvasive voltage probe operating at 4.2 K

Review of Scientific Instruments

Volumn 72, Issue 4, 2001, Pages 2100-2105

  Sellwood, A T ^a   Smith, C G ^a   Linfield, E H ^a   Simmons, M Y ^a,b   Ritchie, D A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035305167     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1351839     Document Type: Article

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