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Volumn 175-177, Issue , 2001, Pages 437-441

Degradation of polyimide by 100 keV He+, Ne+, Ar+ and Kr+ ions

Author keywords

Electrical resistance; ERDA; Ion implantation; Polymers; RBS

Indexed keywords

ARGON; DEGRADATION; ELECTRIC RESISTANCE MEASUREMENT; HELIUM; KRYPTON; NEON; POLYIMIDES; POSITIVE IONS; RADIATION EFFECTS; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 0035301870     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00557-7     Document Type: Conference Paper
Times cited : (11)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.