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Volumn 175-177, Issue , 2001, Pages 437-441
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Degradation of polyimide by 100 keV He+, Ne+, Ar+ and Kr+ ions
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Author keywords
Electrical resistance; ERDA; Ion implantation; Polymers; RBS
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Indexed keywords
ARGON;
DEGRADATION;
ELECTRIC RESISTANCE MEASUREMENT;
HELIUM;
KRYPTON;
NEON;
POLYIMIDES;
POSITIVE IONS;
RADIATION EFFECTS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
VOLATILE DEGRADATION PRODUCTS;
ION BOMBARDMENT;
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EID: 0035301870
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(00)00557-7 Document Type: Conference Paper |
Times cited : (11)
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References (17)
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