On anomalous concentration depth profiles of atoms implanted into polymers

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 568-573

  Hnatowicz, V ^a   Vacik J ^a   Cervena J ^a   Perina V ^a   Svorcik V ^b   Rybka, V ^b  

^a NUCLEAR PHYSICS INSTITUTE   (Czech Republic)

^b INSTITUTE OF CHEMICAL TECHNOLOGY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

POLYMERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

DEPTH PROFILING;

ION IMPLANTATION;

EID: 0032017089     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00669-1     Document Type: Article

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