Atomistic and electronic structure of Al/MgAl2O4 and Ag/MgAl2O4 interfaces

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 81, Issue 4, 2001, Pages 927-955

  Schweinfest, R ^a   Kostlmeier S ^a   Ernst, F ^a   Elsasser C ^a   Wagner, T ^a   Finnis, M W ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b QUEEN'S UNIVERSITY BELFAST   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CARRIER CONCENTRATION; CRYSTAL ATOMIC STRUCTURE; CRYSTALLOGRAPHY; ELECTRONIC STRUCTURE; MAGNESIA; PROBABILITY DENSITY FUNCTION; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON CONFIGURATION;

INTERFACES (MATERIALS);

EID: 0035297862     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610151133375     Document Type: Article

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