Composition analysis of coherent nanoinsertions of solid solutions on the basis of high-resolution electron micrographs

Semiconductors

Volumn 35, Issue 3, 2001, Pages 347-352

  Soshnikov, I P ^a   Gorbenko, O M ^a   Golubok, A O ^b   Ledentsov, N N ^a  

^a IOFFE INSTITUTE   (Russian Federation)

^b INSTITUTE FOR ANALYTICAL INSTRUMENTATION   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035285984     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1356160     Document Type: Article

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