Atomic force microscopy observation of the morphology of tetracyanoquinodimethane (TCNQ) deposited from solution onto the atomically smooth native oxide surface of Al(111) films

Thin Solid Films

Volumn 384, Issue 1, 2001, Pages 90-101

  Higo, M ^a   Lu, X ^b   Mazur, U ^b   Hipps, K W ^b  

^a KAGOSHIMA UNIVERSITY   (Japan)

^b Washington State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; CRYSTAL ORIENTATION; DEPOSITION; MORPHOLOGY; SURFACE ROUGHNESS;

TETRACYANOQUINODIMETHANE;

METALLIC FILMS;

EID: 0035282114     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01807-1     Document Type: Article

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