Morphological observation of tetracyanoquinodimethane deposited from solution onto the atomically smooth native oxide surface of an Al(111) film by atomic force microscopy

Chemistry Letters

Volumn , Issue 7, 1999, Pages 679-680

  Higo, Morihide ^a   Lu, X ^b   Mazur, U ^b   Hipps, K W ^b  

^a KAGOSHIMA UNIVERSITY   (Japan)

^b WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033245529     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.1999.679     Document Type: Article

References (6)

1. S. H. Cohen, M. T. Bray, and M. L. Lightbody, "Atomic Force Microscopy/ Scanning Tunneling Microscopy," Plenum, New York (1994).
2. C. S. Korman and R. V. Coleman, Phys. Rev., B15, 1877 (1977).
3. K. W. Hipps and U. Mazur, Rev. Sci. Instrum., 55, 1120 (1984).
4. H. Iwamoto, M. Higo, and S. Kamata, Advances in X-ray Chemical Analysis Japan, 28, 85 (1997).
5. M. Higo, X. Lu, U. Mazur, and K. W. Hipps, Chem. Lett., 1997, 709; Langmuir, 13, 6176 (1997).
6. M. Higo, X. Lu, U. Mazur, and K. W. Hipps, Chem. Lett., 1997, 709; Langmuir, 13, 6176 (1997).