Characterization of atomically smooth al films by transmission electron microscopy and atomic force microscopy

Chemistry Letters

Volumn , Issue 8, 1997, Pages 709-710

  Higo, Morihide ^a   Lu, X ^b   Mazur, U ^b   Hipps, K W ^b  

^a KAGOSHIMA UNIVERSITY   (Japan)

^b WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0031520960     PISSN: 03667022     EISSN: None     Source Type: Journal    
DOI: 10.1246/cl.1997.709     Document Type: Article

References (5)

1. Y. Martin, "Selected Papers on Scanning Probe Microscopes," SPIE Opt. Eng. Press (1995).
2. B. A. Movchan and A. V. Demchishin, Phys. Met. Metallogr., 28, 83 (1969).
3. K. L. Westra, A. W. Mitchell, and D. J. Thomson, J. Appl. Phys., 74, 3608 (1993).
4. X. Lu, K. W. Hipps, X. D. Wang, and U. Mazur, J. Am. Chem. Soc., 118, 7197 (1996).
5. L. Reimer, "Transmission Electron Microscopy," Springer-Verlag (1993).