Modeling bimodal electromigration failure distributions

Microelectronics Reliability

Volumn 41, Issue 3, 2001, Pages 445-453

  Fischer, A H ^a   Abel, A ^b   Lepper, M ^a   Zitzelsberger, A E ^a   Von Glasow, A ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

^b DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMIGRATION; FAILURE ANALYSIS; MODAL ANALYSIS; NORMAL DISTRIBUTION; SEMICONDUCTOR DEVICE MODELS;

BIMODAL LOG-NORMAL DISTRIBUTIONS; SUPERPOSITION MODELS;

MICROELECTRONICS;

EID: 0035276217     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(00)00246-8     Document Type: Article

References (10)

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