|
Volumn 10, Issue 3-7, 2001, Pages 1268-1272
|
Post-growth rapid thermal annealing effect on hydrogenated amorphous silicon carbide thin film
|
Author keywords
3C SiC; Hydrogenated amorphous silicon carbide; Rapid thermal annealing; Statistically oriented
|
Indexed keywords
AMORPHOUS MATERIALS;
CHEMICAL VAPOR DEPOSITION;
NANOSTRUCTURED MATERIALS;
NUCLEATION;
POLYCRYSTALLINE MATERIALS;
RAMAN SCATTERING;
RAPID THERMAL ANNEALING;
SILICON CARBIDE;
STOICHIOMETRY;
EPITAXIAL RELATION;
THIN FILMS;
SILICON CARBIDE;
|
EID: 0035271212
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(00)00450-7 Document Type: Article |
Times cited : (3)
|
References (20)
|