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Volumn 10, Issue 3-7, 2001, Pages 1115-1120
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Mechanical properties of nanometric structures of Si/SiC, C/SiC and C/SiN produced by PECVD
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Author keywords
a C; a SiN; Amorphous multilayers; Nanostructured materials; ns Si; ns SiC; Plasma enhanced chemical vapor deposition(PECVD)
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Indexed keywords
DEPOSITION;
GLASS FIBER;
MATERIALS;
MECHANICAL PROPERTY;
NANOMETRIC STRUCTURE;
ROOM TEMPERATURE;
SILICON CARBIDE;
ANNEALING;
CRACKS;
CRYSTALLIZATION;
DEHYDROGENATION;
DEPOSITION;
ELASTIC MODULI;
INDENTATION;
ION BOMBARDMENT;
LENSES;
MAGNETIC DEVICES;
MORPHOLOGY;
MULTILAYERS;
OPTICAL FIBERS;
PROTECTIVE COATINGS;
SILICON;
POST-THERMAL TREATMENTS;
NANOSTRUCTURED MATERIALS;
CARBON;
INORGANIC COATING;
MECHANICAL PROPERTY;
SILICON;
SILICON CARBIDE;
SILICON NITRIDE;
WEAR;
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EID: 0035270735
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/S0925-9635(00)00430-1 Document Type: Article |
Times cited : (21)
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References (9)
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