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Volumn 11, Issue 1 III, 2001, Pages 3671-3674

Compositional and microstructural profiles across Nb 3Sn filaments produced by different fabrication methods

Author keywords

Composition gradient; Critical current; Microstructure; Niobium tin compounds

Indexed keywords

COMPOSITION GRADIENT; NIOBIUM TIN COMPOUNDS;

EID: 0035268817     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919861     Document Type: Conference Paper
Times cited : (26)

References (11)
  • 8
    • 0029869524 scopus 로고    scopus 로고
    • Resolution of compositional backscattered electron profiles of single interfaces in the scanning electron microscope
    • January
    • (1996) Scanning , vol.18 , Issue.1 , pp. 13-18
    • Konkol, A.1
  • 9
    • 0031390714 scopus 로고    scopus 로고
    • A Monte Carlo study of the position of phase boundaries in backscattered electron images
    • (1997) Scanning , vol.19 , Issue.8 , pp. 547-552
    • Cousens, D.R.1    Joy, D.C.2
  • 11


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.