Development of IMARAD CZT detectors with PIN contacts

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3768, Issue , 1999, Pages 55-65

  Narita, T ^a   Bloser, P F ^a   Grindlay, J E ^a   Jenkins, J A ^a   Yao, H W ^a  

^a HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELD MEASUREMENT; OHMIC CONTACTS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTOR DEVICES; SEMICONDUCTOR GROWTH; SPECTRUM ANALYSIS;

BRIDGMAN METHOD; CADMIUM ZINC TELLURIDE; DARK CURRENTS; SEMICONDUCTOR DETECTORS; X RAY IMAGING;

RADIATION DETECTORS;

EID: 0033308762     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.366627     Document Type: Conference Paper

References (13)