Three-dimensional compositional analysis of quantum dots

Journal of Physics D: Applied Physics

Volumn 34, Issue 4, 2001, Pages 636-644

  Harvey, A ^a   Davock, H ^b   Dunbar, A ^a   Bangert, U ^a   Goodhew, P J ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; COMPUTER SIMULATION; CONVOLUTION; ELECTRON BEAMS; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS;

THIN FOIL; THREE DIMENSIONAL COMPOSITIONAL ANALYSIS; X RAY LINE SCANS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0035249372     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/4/326     Document Type: Article

References (6)

1. Tang Y S, Sotomayor Torres C M, Whall T E, Parker E H C, Presting H and Kibbel H 1995 J. Mater. Sci.: Mater. Electron. 6 356
2. Liu N, Tersoff J, Baklenov O, Holmes Jr A L and Shih C K 2000 Phys. Rev. Lett. 84 334
3. Goldstein J I, Costly J L, Lorimer G W and Reed S J B 1977 Scanning Electron Microscopy (Chicago: IITRI) p 315
4. Saito H, Nishi K and Sugou S 1999 Appl. Phys. Lett. 74 1224
5. Hasegawa Y, Kiyama H, Xue Q K and Sakurai T 1998 Appl. Phys. Lett. 72 2265
6. Bangert U, Harvey A J, Dieker C, Hartmann A and Keyse R 1996 Phil. Mag. A 74 1421