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Journal of the Ceramic Society of Japan

Volumn 109, Issue 1266, 2001, Pages

Direct analysis of atomic structures of advanced ceramics by high-resolution electron microscopy

(1) Oku, T a

a OSAKA UNIVERSITY (Japan)

Author keywords

Advanced ceramics; Atomic structure; High resolution electron microscopy

Indexed keywords

CARRIER CONCENTRATION; CRYSTAL ATOMIC STRUCTURE; FOURIER TRANSFORMS; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); LATTICE CONSTANTS; SEMICONDUCTOR DOPING; THERMAL EFFECTS;

ATOMIC STRUCTURE ANALYSIS; FOURIER ANALYSIS;

CERAMIC MATERIALS;

EID: 0035247670 PISSN: 09145400 EISSN: None Source Type: Journal
DOI: 10.2109/jcersj.109.1266_S17 Document Type: Article

Times cited : (39)

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