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Volumn 79, Issue 4, 1999, Pages 821-834

Atomic disordering in yb56 detected by high-resolution electron microscopy with residual indices

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040034705     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619908210333     Document Type: Article
Times cited : (26)

References (22)
  • 2
    • 0003545679 scopus 로고
    • second revised edition (Amsterdam: North- Holland)
    • Cowley, J. M., 1981, Diffraction Physics, second revised edition (Amsterdam: North- Holland).
    • (1981) Diffraction Physics
    • Cowley, J.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.