Development of low-temperature and high vacuum atomic force microscope with freeze-fracture function

Review of Scientific Instruments

Volumn 72, Issue 2, 2001, Pages 1445-1448

  Nakamoto, Keiichi ^a   Mooney, C B ^a,b   Iwatsuki, Masashi ^a  

^a JEOL LTD   (Japan)

^b JEOL USA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035247408     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1342033     Document Type: Article

References (12)

1. A. Engel, Y. Lyubchenko, and D. Muller, Trends Cell Biol. 9, 77 (1999).
2. M. Takeuchi, H. Miyamoto, Y. Sako, H. Komizu, and A. Kusumi, Biophys. J. 74, 2171 (1998).
3. M. Aikawa et al., Parasitology Int. 46, 241 (1997).
4. A. Linder, U. Weiland, and H.-J. Apell, J. Struct. Biol. 126, 16 (1999).
5. Z. Liu, M. Zhou, H. Xie, R. Qian, Y. Zhang, J. Hu, and M. Li, Chin. Sci. Bull. 43, 289 (1998).
6. Rapid Freezing, Freeze Fracture, and Deep Etching, edited by N. J. Severs and D. M. Shotton (Wiley, New York, 1995), p. 32.
7. J. Mou, J. Yang, and Z. Shao, Rev. Sci. Instrum. 64, 1483 (1993).
8. Z. Shao and Y. Zhang, Ultramicroscopy 66, 141 (1996).
9. H. Bluhm, S. H. Pan, L. Xu, T. Inoue, D. F. Ogletree, and M. Salmeron, Rev. Sci. Instrum. 69, 1781 (1998).
10. V. Tsai, X.-S. Wang, E. D. Williams, J. Schneir, and R. Dixson, Appl. Phys. Lett. 71, 1495 (1997).
11. P.-C. Zhang, C. Bai, Y.-M. Huang, H. Zhao, Y. Fang, N.-X. Wang, and Q. Li, Scanning Microsc. 9, 981 (1995).
12. Silicon-MDT Ltd., Zelenograd Research Institute of Physical Problems, 103460, Moscow, Russia.