메뉴 건너뛰기




Volumn 84, Issue 2, 2001, Pages 1-7

Amplitude probability distribution measuring equipment with 20-MHz sampling and 8-bit resolution

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; BIT ERROR RATE; COUNTING CIRCUITS; MAGNETOELECTRIC EFFECTS; OPTICAL RESOLVING POWER; PROBABILITY DISTRIBUTIONS;

EID: 0035204007     PISSN: 87566621     EISSN: None     Source Type: Journal    
DOI: 10.1002/1520-6424(200102)84:2<1::AID-ECJA1>3.0.CO;2-L     Document Type: Article
Times cited : (2)

References (15)
  • 2
    • 11744342764 scopus 로고
    • Statistical parameter measurement of unwanted emission from microwave oven
    • in Japanese
    • Yamanaka Y, Shinozuka T. Statistical parameter measurement of unwanted emission from microwave oven. Tech Rep IEICE 1994;EMCJ94-29. (in Japanese)
    • (1994) Tech Rep IEICE , vol.EMCJ94-29
    • Yamanaka, Y.1    Shinozuka, T.2
  • 3
    • 0010446348 scopus 로고    scopus 로고
    • Measurement and estimation of BER degradation of PHS due to electromagnetic disturbance from microwave ovens
    • in Japanese
    • Yamanaka Y, Shinozuka T. Measurement and estimation of BER degradation of PHS due to electromagnetic disturbance from microwave ovens. Trans IEICE 1996;J79-B-II:827-834. (in Japanese)
    • (1996) Trans IEICE , vol.J79-B-II , pp. 827-834
    • Yamanaka, Y.1    Shinozuka, T.2
  • 4
    • 10444220548 scopus 로고    scopus 로고
    • A study on the effect of microwave oven interference to the performance of digital radio communications systems
    • in Japanese
    • Miyamoto S, Yamanaka Y, Shinozuka T,Morinaga N. A study on the effect of microwave oven interference to the performance of digital radio communications systems. Trans IEICE 1996;J79-B-II:835-84. (in Japanese)
    • (1996) Trans IEICE , vol.J79-B-II , pp. 835-884
    • Miyamoto, S.1    Yamanaka, Y.2    Shinozuka, T.3    Morinaga, N.4
  • 6
    • 0029474841 scopus 로고    scopus 로고
    • Statistical parameter measurement of unwanted emission from microwave ovens
    • Yamanaka Y, Shinozuka T. Statistical parameter measurement of unwanted emission from microwave ovens. 1995 IEEE Int Symp on EMC, p 57-61.
    • 1995 IEEE Int Symp on EMC , pp. 57-61
    • Shinozuka T, Y.Y.1
  • 9
    • 14344278318 scopus 로고    scopus 로고
    • A method for achieving a high-resolution APD measuring circuit
    • CAS96-110, DSP96-161, CS96-166. in Japanese
    • Uchino M, Hayashi Y, Shinozuka T. A method for achieving a high-resolution APD measuring circuit. Tech Rep IEICE 1997;CAS96-110, DSP96-161, CS96-166. (in Japanese)
    • (1997) Tech Rep IEICE
    • Uchino, M.1    Hayashi, Y.2    Shinozuka, T.3
  • 10
    • 0030673934 scopus 로고    scopus 로고
    • Development of low-cost high-resolution APD measuring equipment
    • Beijing
    • Uchino M, Hayashi Y, Shinozuka T, Sato R. Development of low-cost high-resolution APD measuring equipment. Proc Int Symp on EMC, Beijing, p 253-256, 1997.
    • (1997) Proc Int Symp on EMC , pp. 253-256
    • Uchino, M.1    Hayashi, Y.2    Shinozuka, T.3    Sato, R.4
  • 11
    • 14344273271 scopus 로고    scopus 로고
    • Disturbance measurement using wide band APD measuring equipment
    • in Japanese
    • Uchino M, Hayashi Y, Shinozuka T, Sato R. Disturbance measurement using wide band APD measuring equipment. Tech Rep IEICE 1997;EMCJ97-57, MW97-97. (in Japanese)
    • (1997) Tech Rep IEICE , vol.EMCJ97-57
    • Uchino, M.1    Hayashi, Y.2    Shinozuka, T.3    Sato, R.4
  • 12
    • 14344278524 scopus 로고
    • Statistical study of atmospheric radio noise
    • Ishida T. Statistical study of atmospheric radio noise. Rev Radio Res Lab 1962;8:381-455.
    • (1962) Rev Radio Res Lab , vol.8 , pp. 381-455
    • Ishida, T.1
  • 13
    • 0012302921 scopus 로고
    • On the theory of amplitude distribution of impulsive random noise and its application to the atmospheric noise
    • Furutsu K, Ishida T. On the theory of amplitude distribution of impulsive random noise and its application to the atmospheric noise. J Radio Res Lab 1960;7:279-302.
    • (1960) J Radio Res Lab , vol.7 , pp. 279-302
    • Furutsu, K.1    Ishida, T.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.