Statistical parameter measurement of unwanted emission from microwave ovens

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1995, Pages 57-61

  Yamanaka, Yukio ^a   Shinozuka, Takashi ^a  

^a NATIONAL INSTITUTE OF INFORMATION AND COMMUNICATIONS TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL COMMUNICATION SYSTEMS; FREQUENCY DOMAIN ANALYSIS; MAGNETRONS; MICROWAVE OVENS; OSCILLATIONS; PERFORMANCE; PROBABILITY; STATISTICAL METHODS; TIME DOMAIN ANALYSIS;

AMPLITUDE PROBABILITY DISTRIBUTION; CROSSING RATE DISTRIBUTION; DIGITAL MOBILE COMMUNICATION SYSTEMS; MAGNETRON OSCILLATIONS; OUT OF BAND EMISSION; PULSE DURATION DISTRIBUTION; PULSE SPACING DISTRIBUTION;

ELECTROMAGNETIC WAVE EMISSION;

EID: 0029474841     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)