Development of low-cost high-resolution APD measuring equipment

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 1997, Pages 253-256

  Uchino, Masaharu ^a   Hayashi, Yoshinobu ^a   Shinozuka, Takashi ^a   Sato, Risaburo ^a  

^a EMC Lab Co Ltd   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; COUNTING CIRCUITS; INTEGRATED CIRCUITS; PROBABILITY;

AMPLITUDE PROBABILITY DISTRIBUTION (APD); RESIDUE NUMBER SYSTEM (RNS);

DIGITAL COMMUNICATION SYSTEMS;

EID: 0030673934     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/elmagc.1997.617135     Document Type: Conference Paper

References (7)