Recent radiation damage and single event effect results for candidate spacecraft electronics

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 82-99

  O'Bryan, M V ^a   LaBel, K A ^a   Reed, R A ^a   Ladbury, R L ^a   Howard J W , Jr ^a   Buchner, S P ^a   Barth, J L ^a   Kniffin, S D ^a   Seidleck, C M ^a   Marshall, C J ^a   Marshall, P W ^a   Kim, H S ^a   Hawkins, D K ^a   Carts, M A ^a   Forney, J D ^a   Sanders, A B ^a   Cox, S R ^a   Dunsmore, C J ^a   Palor, C ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DIGITAL TO ANALOG CONVERSION; HEAVY IONS; OPTOELECTRONIC DEVICES; RADIATION DAMAGE; SEMICONDUCTOR DEVICES; SPACE APPLICATIONS;

SINGLE EVENT EFFECT (SEE);

SPACECRAFT EQUIPMENT;

EID: 0035166716     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (36)

1. Development of a test methodology for single event transients (SETs) in linear devices
2. Total dose and single event effects testing of the intel pentium III (P3) and AMD K7 microprocessors
3. Recent radiation damage and single event effect results for microelectronics
4. Proton-induced single event upset characterization of a 1 giga-sample per second analog to digital converter
5. Assessing the impact of the space radiation environment on parametric degradation and single event transients in optocouplers