Comparison of gate structures for short-channel SOI MOSFETs

IEEE International SOI Conference

Volumn , Issue , 2001, Pages 115-116

  Park, J T ^a   Colinge, C A ^a   Colinge, J P ^a  

^a SolarLight Ltd   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; GATES (TRANSISTOR); SEMICONDUCTOR DEVICE STRUCTURES; SILICON ON INSULATOR TECHNOLOGY; THIN FILMS;

GATE STRUCTURES;

MOSFET DEVICES;

EID: 0035159965     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)