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Volumn 42, Issue 1, 2001, Pages 28-32
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TEM observation of dislocation emission from a crack at DBTT in Si
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Author keywords
Crack tip; Dislocation; Ductile brittle transition; Focused ion beam; Silicon; Transmission electron microscopy
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Indexed keywords
CRACK PROPAGATION;
CRACKS;
DISLOCATIONS (CRYSTALS);
ION BEAMS;
SEMICONDUCTING SILICON;
TRANSMISSION ELECTRON MICROSCOPY;
DUCTILE-BRITTLE TRANSITION TEMPERATURES (DBTT);
SINGLE CRYSTALS;
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EID: 0034989209
PISSN: 13459678
EISSN: None
Source Type: Journal
DOI: 10.2320/matertrans.42.28 Document Type: Article |
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Times cited : (3)
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References (13)
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