Barrier-height imaging of Cs-adsorbed Si(111)

Applied Surface Science

Volumn 169-170, Issue , 2001, Pages 202-205

  Yoshikawa, Jun ^a   Kurokawa, Shu ^a   Sakai, Akira ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CESIUM; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON;

BARRIER-HEIGHT IMAGING;

SURFACE PHENOMENA;

EID: 0035127452     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00651-6     Document Type: Article

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