Preparation and characterization of hydrogen terminated 6H-SiC

Materials Science Forum

Volumn 353-356, Issue , 2001, Pages 223-226

  Sieber, N ^a   Seyller, Th ^a   Mantel, B F ^a   Ristein, J ^a   Ley, L ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; FERMI LEVEL; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; HYDROGEN; HYDROGEN BONDS; HYDROGENATION; LOW ENERGY ELECTRON DIFFRACTION; PASSIVATION; PHOTOELECTRON SPECTROSCOPY; SURFACES;

ATTENUATED TOTAL REFLECTION; BAND BENDING; DISPROPORTIONATION; HYDROGEN TERMINATION; SURFACE PERIODICITY;

SILICON CARBIDE;

EID: 0035127387     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/msf.353-356.223     Document Type: Article

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