메뉴 건너뛰기




Volumn 79, Issue 1, 2001, Pages 49-54

Thin film of aluminum oxide through pulsed laser deposition: A micro-Raman study

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; RAMAN SPECTROSCOPY; SUBSTRATES; THIN FILMS;

EID: 0035090699     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(00)00554-7     Document Type: Article
Times cited : (91)

References (13)
  • 12
    • 1842267002 scopus 로고
    • H.D. Bist, J.R. Durig, & J.F. Sullivan. Amsterdam: Elsevier
    • Jayaraman A. Bist H.D., Durig J.R., Sullivan J.F. Raman Spectroscopy Sixty Years. 1989;Elsevier, Amsterdam.
    • (1989) Raman Spectroscopy Sixty Years
    • Jayaraman, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.