Tapping-mode tuning-fork near-field scanning optical microscopy of low power semiconductor lasers

Journal of Microscopy

Volumn 202, Issue 1, 2001, Pages 172-175

  Lu, N H ^a   Lin, W C ^a   Tsai, D P ^a,b  

^a Sze Hai Institute of Technology and Commerce   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

Evanescent waves; Near field scanning optical microscopy; Semiconductor laser; Tapping mode

Indexed keywords

EMISSION SPECTROSCOPY; III-V SEMICONDUCTORS; INCIDENT LIGHT; OPTICAL DATA STORAGE; REFRACTIVE INDEX; RESONATORS; SEMICONDUCTOR DIODES; SEMICONDUCTOR LASERS; SHEAR FLOW;

EVANESCENT WAVE; LOW POWER; MODE TUNING; MULTI-QUANTUM WELL LASER DIODES; MULTIQUANTUM WELL LASER DIODES; NEAR FIELDS; NEARFIELD SCANNING OPTICAL MICROSCOPY; POWER SEMICONDUCTORS; TAPPING MODES; TUNING-FORK;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

AMPLITUDE MODULATION; CONFERENCE PAPER; CONTACT ANGLE; DIODE; FORCE; LASER; PRIORITY JOURNAL; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SEMICONDUCTOR; SPECTRUM;

EID: 0035061767     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2001.00801.x     Document Type: Conference Paper

References (9)

1. 0.5P quaternary alloys
2. Near-field scanning optical microscopy studies of V-grooved quantum wire lasers
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5. Near-field spectroscopy of selectively oxidized vertical cavity surface emitting lasers
6. Near-field photocurrent spectroscopy: A novel technique for studying defects and aging in high-power semiconductor lasers
7. Optical characterization of visible multiquantum-well semiconductor lasers by collection/excitation modes of scanning near-field optical microscopy
8. Tapping-mode tuning fork force sensing for near-field scanning optical microscopy
9. Imaging local index variations in an optical waveguide using a tapping-mode near-field scanning optical microscope