A polymorph crystal structure of hexaphenyl observed in thin films

Crystal Research and Technology

Volumn 36, Issue 1, 2001, Pages 47-54

  Resel, R ^a   Koch, N ^a   Meghdadi, F ^a   Leising, G ^a   Athouel, L ^b   Froyer, G ^b   Hofer, F ^c  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

^c GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Electron diffraction; Organic semiconductors; Physical vapor deposition; Polycrystalline thin films; X ray diffraction

Indexed keywords

HERRINGBONE PATTERNS;

CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; FILM GROWTH; LATTICE CONSTANTS; PHYSICAL VAPOR DEPOSITION; SINGLE CRYSTALS; SUBSTRATES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 0035059774     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4079(200101)36:1<47::AID-CRAT47>3.0.CO;2-X     Document Type: Article

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