SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 409, Issue 2, 1998, Pages 302-306

High resolution X-ray diffraction studies on hexaphenyl thin films

(2) Resel, R a Leising, G a

a GRAZ UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

Aromatics; Crystalline amorphous interfaces; Crystallisation; X ray diffraction

Indexed keywords

AROMATIC COMPOUNDS; CRYSTAL STRUCTURE; CRYSTALLIZATION; FILM PREPARATION; INTERFACES (MATERIALS); SURFACE STRUCTURE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLINE AMORPHOUS INTERFACES; HEXAPHENYL THIN FILMS;

FILM GROWTH;

EID: 0032120686 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(98)00230-1 Document Type: Article

Times cited : (28)

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