Observation of nano-size ferroelectric domains and crystals polarity using scanning nonlinear dielectric microscopy

Integrated Ferroelectrics

Volumn 32, Issue 1-4, 2001, Pages

  Odagawa, H ^a   Cho, Y ^a   Kazuta, S ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Atomic force microscope; Determination of crystal polarity; Ferroelectric materials; Scanning nonlinear dielectric microscopy; ZnO thin film

Indexed keywords

FERROELECTRIC THIN FILMS; LEAD COMPOUNDS; MORPHOLOGY; STRONTIUM COMPOUNDS; SUBSTRATES; SURFACES;

CRYSTAL POLARITY; NANOSIZE FERROELECTRIC DOMAINS; SCANNING NONLINEAR DIELECTRIC MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0035037267     PISSN: 10584587     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)