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Volumn 69, Issue 6, 1999, Pages 581-589
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Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples
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Author keywords
[No Author keywords available]
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Indexed keywords
IMAGE PROCESSING;
LIGHT REFLECTION;
LIGHT TRANSMISSION;
OPTICAL RESOLVING POWER;
SCANNING;
SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM);
OPTICAL MICROSCOPY;
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EID: 0033321579
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s003390051036 Document Type: Article |
Times cited : (20)
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References (21)
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