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Volumn 69, Issue 6, 1999, Pages 581-589

Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; LIGHT REFLECTION; LIGHT TRANSMISSION; OPTICAL RESOLVING POWER; SCANNING;

EID: 0033321579     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390051036     Document Type: Article
Times cited : (20)

References (21)
  • 6
    • 0343782685 scopus 로고    scopus 로고
    • Omicron Vakuumphysik GmbH, Taunusstein, Germany
    • Omicron Vakuumphysik GmbH, Taunusstein, Germany
  • 16
    • 0003342859 scopus 로고
    • Surface plasmons on smooth and rough surfaces and on gratings
    • Springer, Berlin, Heidelberg
    • H. Raether: Surface Plasmons on Smooth and Rough Surfaces and on Gratings (Springer Tracts Mod. Phys., Vol 111, Springer, Berlin, Heidelberg 1988)
    • (1988) Springer Tracts Mod. Phys. , vol.111
    • Raether, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.