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Volumn , Issue , 2001, Pages 289-293
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Novel nondestructive and non-electrical-contact failure analysis technique - laser-SQUID microscopy
a
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DEFECTS;
FAILURE ANALYSIS;
LSI CIRCUITS;
MAGNETOMETERS;
NONDESTRUCTIVE EXAMINATION;
OPTICAL MICROSCOPY;
PRINTED CIRCUIT BOARDS;
LASER SQUID MICROSCOPY;
SPATIAL RESOLUTION;
SQUIDS;
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EID: 0035016013
PISSN: 00999512
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (7)
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References (9)
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