Automatic generation of diagnostic March tests

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2001, Pages 299-304

  Niggemeyer, D ^a   Rudnick, E M ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; C (PROGRAMMING LANGUAGE); COMPUTER SIMULATION; DATA STORAGE EQUIPMENT; DATA STRUCTURES; FAILURE ANALYSIS; GRAPH THEORY; OPTIMIZATION;

DIAGNOSTIC MARCH TESTS; GREEDY BASED ALGORITHM; SEARCH TREE STRUCTURE; STATE TRANSITION GRAPH;

BUILT-IN SELF TEST;

EID: 0035015860     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

1. Carafe: An inductive fault analysis tool for CMOS VLSI circuits
2. Diagnostic testing of embedded memories based on output tracing
3. Fault diagnosis of RAM's from random testing experiments
4. Built-in self-diagnosis for repairable embedded RAMs
5. Diagnostic RAM tests
6. Generating march tests automatically
7. A new framework for generating optimal March tests for memory arrays
8. Simulation-based test algorithm generation for random access memories
9. March tests for word-oriented memories
10. Near-optimal tests for classes of write-triggered coupling faults in RAMs
11. An algebra of multiple faults in RAMs