Magnetic property and interface structure of Ta/NiO/NiFe/Ta

Chinese Science Bulletin

Volumn 46, Issue 5, 2001, Pages 438-440

  Yu, G ^a   Chai, C ^a   Zhu, F ^a   Xiao, J ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

Author keywords

Exchange coupling; Interface reaction; NiO; X ray photoelectron spectroscopy

Indexed keywords

IRON; NICKEL; TANTALUM;

ARTICLE; DECOMPOSITION; MAGNETISM; STRUCTURE ANALYSIS; THERMODYNAMICS; X RAY SPECTROMETRY;

EID: 0035011275     PISSN: 10016538     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf03183284     Document Type: Article

References (11)

1. Exchange biasing in NiO spin valves
2. A study of the NiFe/NiMn exchange couple
3. Spin-valve heads utilizing antiferromagnetic NiO layers
4. Exchange coupling between NiO and NiFe thin film
5. 19/NiO films and thermal stability of NiO film
6. NiO exchange bias layers grown by direction beam sputtering of a nickel oxide target
7. The effect microstructure and interface conditions on the anisotropic exchange fields of NiO/NiFe
8. Exploration of magnetization reversal and coercivity of epitaxial NiO {111}/NiFe films
9. Exchange-coupled Ni-Fe/Ni-Mn and NiO/Ni-Fe films for stabilization of magnetoresistive sensors