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Volumn 78-79, Issue , 2001, Pages 401-406
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A system for ultra-fast transient ion and pulsed laser current microscopies as a function of temperature
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Author keywords
Charge collection; Cryogenic stage; Scanning ion deep level transient spectroscopy; Single event upset; Transient ion beam induced current; Transient laser beam induced current
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Indexed keywords
CONTROL SYSTEM SYNTHESIS;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
INDUCED CURRENTS;
ION BEAMS;
LASER BEAMS;
MICROSCOPIC EXAMINATION;
RADIATION EFFECTS;
SCANNING;
THERMAL EFFECTS;
CHAMBER COLLECTION SYSTEM;
DATA COLLECTION SYSTEM;
PULSED LASER CURRENT MICROSCOPIES;
SCANNING ION DEEP LEVEL TRANSIENT SPECTROSCOPY;
SINGLE EVENT PHENOMENON;
SINGLE EVENT UPSET;
TRANSIENT ION BEAM INDUCED CURRENT MEASUREMENT SYSTEM;
TRANSIENT LASER BEAM INDUCED CURRENT MEASUREMENT SYSTEM;
ULTRAFAST TRANSIENT ION MICROSCOPIES;
SPECTROMETRY;
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EID: 0034996717
PISSN: 10120394
EISSN: None
Source Type: Book Series
DOI: 10.4028/www.scientific.net/ssp.78-79.401 Document Type: Conference Paper |
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Times cited : (8)
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References (15)
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