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Volumn 366-368, Issue , 2001, Pages 549-559
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Thin-layer materials
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Author keywords
[No Author keywords available]
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Indexed keywords
ANELASTIC RELAXATION;
CHARGE CARRIERS;
DISLOCATIONS (CRYSTALS);
ELECTRIC CURRENTS;
ELECTROMIGRATION;
FRICTION;
GRAIN BOUNDARIES;
MECHANICAL PROPERTIES;
MICROELECTRONICS;
NUMERICAL METHODS;
POINT DEFECTS;
SPECTROSCOPIC ANALYSIS;
CONSTITUTIVE EQUATIONS;
INTERCONNECTING LINES;
MECHANICAL SPECTROSCOPY;
THIN LAYER MATERIALS;
THIN FILMS;
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EID: 0034990369
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: None Document Type: Article |
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Times cited : (8)
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References (18)
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