Surface roughness effects in dual beam illumination speckle interferometers: Theoretical study

Optik (Jena)

Volumn 112, Issue 4, 2001, Pages 163-168

  Joenathan, C ^a   Torroba, R ^b   Henao, R ^c  

^a ROSE HULMAN INSTITUTE OF TECHNOLOGY   (United States)

^b CENTRO DE INVESTIGACIONES OPTICAS   (Argentina)

^c Universitad De Antioquia   (Colombia)

Author keywords

Interferometry; Speckle interferometry; Speckle phenomena; Surface roughness

Indexed keywords

FAST FOURIER TRANSFORMS; INTERFEROMETRY; LIGHT MODULATION; SPECKLE; SURFACE ROUGHNESS;

ASYMMETRIC ILLUMINATION; DUAL BEAM ILLUMINATION SPECKLE INTERFEROMETER;

INTERFEROMETERS;

EID: 0034964807     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: 10.1078/0030-4026-00034     Document Type: Article

References (14)

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6. A new Fourier-transform speckle interferometic method for measuring large object deformation
7. Large in-plane displacement measurement in dual beam speckle interferometer using temporal phase measurement
8. Shape measurement by use of temporal Fourier transform in dual beam illumination speckle interferometry
9. Speckle interferometry with temporal phase evaluation: Influence of decorrelation, speckle size, and nonlinearity of the camera
10. Optical surface roughness determination using speckle correlation technique
11. Real time measurement of surface roughness by correlation of speckle patterns
12. DSPI applied to surface roughness study
13. The scattering of electromagnetic waves from rough surfaces
14. Increasing the sensitivity by two-fold in ESPI