Twofold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry

Optical Engineering

Volumn 35, Issue 7, 1996, Pages 1943-1948

  Sohmer, Alexander ^a   Joenathan, Charles ^a  

^a ROSE HULMAN INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Electronic speckle pattern interferometry; Speckle interferometry

Indexed keywords

EID: 0000409979     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.600770     Document Type: Article

References (6)

1. R. Jones and C. Wykes, Holographic and Speckle Interferometry, Cambridge Univ. Press, Cambridge, UK (1983).
2. J. A. Leendertz, "Interferometric displacement measurement on scattering surfaces utilizing speckle effect," J. Physics E: Sci. Instrum. 3, 214-218 (1970).
3. C. Joenathan, A. Sohmer, and L. Bürkle, "Increased sensitivity to in-plane displacements in electronic speckle pattern interferometry," Appl. Opt. 34(16), 2880-2885 (1995).
4. R. S. Sirohi and N. Krishna Mohan, "In-plane displacement measurement configuration with twofold sensitivity," Appl. Opt. 32(31), 6387-6390 (1993).
5. C. Joenathan, B. Franze, and H. J. Tiziani, "Oblique incidence and observation electronic speckle pattern interferometry," Appl. Opt. 32(31), 7307-7311 (1994).
6. S. Timoshenko and J. N. Goodier, Theory of Elasticity, 2nd ed. McGraw-Hill, New York (1951).